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Optocoupler Broadcom QCPL-325J-500E designed with reliability data from Broadcom internal wafer tests

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Optocoupler Broadcom QCPL-325J-500E designed with reliability data from Broadcom internal wafer tests

Product Overview

This document presents reliability data for Broadcom's Smart Gate Drive Optocoupler family, including models HCPL-316J, ACPL-331J/332J, ACPL-330J/333J, and QCPL-325J/329J. The data is derived from Broadcom's internal testing, utilizing similar wafer technology across these products. The reliability data reflects actual test results on a per-channel basis, with devices preconditioned at MSL 1 using a solder reflow process and temperature cycling. These optocouplers are designed for applications where reliable switching performance is critical. The data provided is specific to Broadcom devices and processes and is not transferable to other manufacturers' similar part types.

Product Attributes

  • Brand: Broadcom
  • Technology: Similar wafer technology used across product family
  • Data Source: Broadcom Ltd. reliability test data

Technical Specifications

Model(s)Test ConditionTotal Device TestedTotal Device HoursNumber of Failed UnitsDemonstrated MTTF (hr) at TA = +125CDemonstrated FITs at TA = +125C
HCPL-316J, ACPL-331J/332J, ACPL-330J/333J, QCPL-325J/329JTA = 125C, VCC Bias (Based on DS)984984,0000984,0001,016
Model(s)Ambient Temperature (C)Junction Temperature (C)Typical MTTF (Hr/Fail) (60% Confidence)Typical FITs (Fail/109h) (60% Confidence)90% Confidence MTTF (Hr/Fail)90% Confidence FITs (Fail/109h)
HCPL-316J, ACPL-331J/332J, ACPL-330J/333J, QCPL-325J/329J1251401,073,895931427,3462,340
1201351,245,007803495,4382,018
1101251,692,121591673,3631,485
1001152,336,469428929,7751,076
901053,281,7313051,305,932766
80954,695,3132131,868,453535
70856,853,5691462,727,309367
607510,223,715984,068,425246
506515,616,306646,214,353161
405524,477,415419,740,543103
304539,466,5092515,705,30364
254050,691,0712020,172,00550

2410010101_Broadcom-QCPL-325J-500E_C2837512.pdf

Quality Optocoupler Broadcom QCPL-325J-500E designed with reliability data from Broadcom internal wafer tests for sale
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